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Low-temperature conductivity of Si(111)-(7x7) surface

Keywords:

A.A. Mayzlakh – Student, Moscow Institute of Physics and Technology, Engineer, Kotelnikov IRE RAS. E-mail: mayzlah@cplire.ru S.V. Zaitsev-Zotov – Dr.Sc. (Phys.-Math.), Head of Laboratory, Kotelnikov IRE RAS


Conductivity of Si(111)-(7x7) surface reconstruction was studied in temperature range 10-320 K. Measurements were provided with the two-probe method. Our results demonstrate that conductivity dependence is represented with Efros–Shklovskii law with EES = 0,55 eV.
References:

 

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  4. Odobescu A.B. and Zaitsev-Zotov S.V. // J. Phys.: Condens. Matter. 2012. V. 24. 395003.
  5. Odobescu A.B. and Zaitsev-Zotov S.V. Book of abstracts of the 3 International School on Surface Science «Technologies and Measurements on Atomic Scale» (Khosta (Sochi). 2013. R.6.URL: http://sss-tmas.org/index.php/component/docman/doc_download/21-proceedings-of-sss-tmas-2013?Itemid=

 

 

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