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The impact of thermal inertance on transistor oscillator noise characteristics

Keywords:

A.V. Kononov – Ph. D. (Eng.). E-mail: UnCordel@yandex.ru


The impact of inertial thermal feedback, which occurs owing to transistor electrophysical parameters temperature dependence, on transistor oscillator with self-bias noise characteristics is theoretically analyzed. The main attention focuses on the single-circuit quasi-harmonic signal oscillators using bipolar junction transistors. The oscillator CAD model is based on the system of Evtyanov’s symbolic shortened differential equations in a fixed-frequency approximation. Conditions for appearing of the device’s sharp amplitude and phase noise degradation caused by temperature dynamics are revealed.
References:

 

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