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Measurement of dielectric parameters using microwave coaxial Bragg structure

DOI 10.18127/j00338486-201907(10)-02

Keywords:

D.A. Usanov – Honored Scientist of RF, Dr.Sc.(Phys.-Math.), Professor, Head of Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky
S.A. Nikitov – Corresponding Member of RAS, Director of Kotel'nikov IRE of RAS (Moscow)
E-mail: nikitov@cplire.ru
A.V. Skripal – Dr.Sc.(Phys.-Math.), Professor,  Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky
D.V. Ponomarev – Ph.D.(Phys.-Math.), Associate Professor, Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky
E-mail: ponomarev87@mail.ru
O.M. Ruzanov – Post-graduate Student, Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky
E-mail: zodiark@list.ru
I.O. Timofeev – Post-graduate Student, Department of Solid State Physics, Saratov State University named after N.G. Chernyshevsky
E-mail: i.o.timofeew@yandex.ru


In the present work the microwave coaxial Bragg structure, using as a sensor that ensures the implementation of a technique for measuring the dielectric constant and dielectric loss tangent of materials and structures, have been presented in the form of dis-mountable coaxial transmission line section, with a coaxial photonic crystal (CPC) inside it formed as a dielectric filling with periodically varying dielectric constant. In this case, the measured sample played the role of the periodicity defect in the Bragg structure, which led to the appearance of a defect mode in the band gap at its amplitude-frequency characteristic. One-dimensional CPCs, composed of 11 layers, have been considered in the frequency range 7…12 GHz. Odd layers of CPC were segments with Teflon filling (ε = 2,1), even – segments with air filling (ε = 1). The length of odd and even segments was 8 mm and 22,56 mm, respectively. The inner diameter of the outer conductor was 7 mm, the outer diameter of the inner conductor was 3 mm. To calculate the transmission and reflection coefficients of an electromagnetic wave in a CPC, a transfer matrix of a complex quadrupole, which is a cascade connection of elementary quadrupoles with known transmission matrices, was used. The measuring section containing the investigated CPC was connected to the Agilent PNA X N5242A Network Analyzer using a 50 ohm coaxial transmission line. On the basis of solving the inverse problem by the least squares method using measured frequency dependences of the transmittance and reflection at the frequency of the defect mode in the CPC band gap, the dielectric constant and tangent of the dielectric loss tangent of samples made of Teflon, caprolon, ebonite and laminate have been determined. The relative error in determining the relative dielectric constant and the dielectric loss tangent at the resonant frequency of the defect mode was less than 1% and 20%, respectively.

References:
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